The meeting was attended by:
| Full name |
Company representative |
| Oleg Fedorovich Vyvenko |
Saint Petersburg State University, Interdisciplinary resource center for nanotechnology, professor, doctor of physical and mathematical sciences |
| Pavel Sergeevich Kuvalkin |
JSC RRI Electronstandart, clean room equipment maintenance engineer, chief engineer |
| Konstantin Aleksandrovich Molchanov |
JSC RRI Electronstandart, physicotechnical analysis department, chief engineer |
| Marta Igorevna Zvyagina |
JSC RRI Electronstandart, physicotechnical analysis department, engineer |
As a result of the meeting the participants concluded: technological capabilities of the Interdisciplinary resource center of Saint Petersburg University allow extension of the existing methods of JSC RRI Electronstandart in terms of detection of counterfeit products and solving the tasks of studying materials and structures of the electronic component base with regard to:
1. spectral analysis of substances using the Fourier IR-spectrometry, Raman scattering, raster electronic microscopy with an integrated laser ablation system;
2. creation of thin (to dozens of microns) wafers with low roughness;
3. obtaining structure sections for precision layer-by-layer analysis using optical and raster microscopy methods.
